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Counting and Integrating Microelectronics Development for Direct Conversion X-ray Imaging

dc.contributor.advisorWermes, Norbert
dc.contributor.authorKraft, Edgar
dc.date.accessioned2020-04-12T12:45:35Z
dc.date.available2020-04-12T12:45:35Z
dc.date.issued2008
dc.identifier.urihttp://hdl.handle.net/20.500.11811/3579
dc.description.abstractA novel signal processing concept for X-ray imaging with directly converting pixelated semiconductor sensors is presented. The novelty of this approach compared to existing concepts is the combination of charge integration and photon counting in every single pixel. Simultaneous operation of both signal processing chains extends the dynamic range beyond the limits of the individual schemes and allows determination of the mean photon energy. Medical applications such as X-ray computed tomography can benefit from this additional spectral information through improved contrast and the ability to determine the hardening of the tube spectrum due to attenuation by the scanned object. A prototype chip in 0.35-micrometer technology has been successfully tested. The pixel electronics are designed using a low-swing differential current mode logic. Key element is a configurable feedback circuit for the charge sensitive amplifier which provides continuous reset, leakage current compensation and replicates the input signal for the integrator. The thesis focusses on the electronic characterization of a second generation prototype chip and gives a detailed discussion of the circuit design.
dc.language.isoeng
dc.rightsIn Copyright
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.subjectRöntgendetektor
dc.subjectSignalverarbeitung
dc.subjectMikroelektronik
dc.subjectX-ray detector
dc.subjectsignal processing
dc.subjectmicroelectronics
dc.subject.ddc530 Physik
dc.titleCounting and Integrating Microelectronics Development for Direct Conversion X-ray Imaging
dc.typeDissertation oder Habilitation
dc.publisher.nameUniversitäts- und Landesbibliothek Bonn
dc.publisher.locationBonn
dc.rights.accessRightsopenAccess
dc.identifier.urnhttps://nbn-resolving.org/urn:nbn:de:hbz:5N-13241
ulbbn.pubtypeErstveröffentlichung
ulbbnediss.affiliation.nameRheinische Friedrich-Wilhelms-Universität Bonn
ulbbnediss.affiliation.locationBonn
ulbbnediss.thesis.levelDissertation
ulbbnediss.dissID1324
ulbbnediss.date.accepted18.10.2007
ulbbnediss.fakultaetMathematisch-Naturwissenschaftliche Fakultät
dc.contributor.coRefereeBrock, Ian C.


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