The Belle II DEPFET Pixel Vertex DetectorDevelopment of a Full-Scale Module Prototype
The Belle II DEPFET Pixel Vertex Detector
Development of a Full-Scale Module Prototype
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DissertationDate of Exam
18.11.2013Date of Publication
28.11.2013Advisor
Wermes, NorbertCo-Referee
Desch, KlausMetadata
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Abstract
The Belle II experiment, which will start after 2015 at the SuperKEKB accelerator in Japan, will focus on the precision measurement of the CP-violation mechanism and on the search for physics beyond the Standard Model. A new detection system with an excellent spatial resolution and capable of coping with considerably increased background is required. To address this challenge, a pixel detector based on DEPFET technology has been proposed. A new all silicon integrated circuit, called Data Handling Processor (DHP), is implemented in 65 nm CMOS technology. It is designed to steer the detector and preprocess the generated data. The scope of this thesis covers DHP tests and optimization as well the development of its test environment, which is the first Full-Scale Module Prototype of the DEPFET Pixel Vertex detector.
Classification (DDC)
530 PhysikLemarenko, Mikhail: The Belle II DEPFET Pixel Vertex Detector : Development of a Full-Scale Module Prototype. - Bonn, 2013. - Dissertation, Rheinische Friedrich-Wilhelms-Universität Bonn.
Online-Ausgabe in bonndoc: https://nbn-resolving.org/urn:nbn:de:hbz:5n-34222
Online-Ausgabe in bonndoc: https://nbn-resolving.org/urn:nbn:de:hbz:5n-34222
@phdthesis{handle:20.500.11811/5796,
urn: https://nbn-resolving.org/urn:nbn:de:hbz:5n-34222,
author = {{Mikhail Lemarenko}},
title = {The Belle II DEPFET Pixel Vertex Detector : Development of a Full-Scale Module Prototype},
school = {Rheinische Friedrich-Wilhelms-Universität Bonn},
year = 2013,
month = nov,
note = {The Belle II experiment, which will start after 2015 at the SuperKEKB accelerator in Japan, will focus on the precision measurement of the CP-violation mechanism and on the search for physics beyond the Standard Model. A new detection system with an excellent spatial resolution and capable of coping with considerably increased background is required. To address this challenge, a pixel detector based on DEPFET technology has been proposed. A new all silicon integrated circuit, called Data Handling Processor (DHP), is implemented in 65 nm CMOS technology. It is designed to steer the detector and preprocess the generated data. The scope of this thesis covers DHP tests and optimization as well the development of its test environment, which is the first Full-Scale Module Prototype of the DEPFET Pixel Vertex detector.},
url = {https://hdl.handle.net/20.500.11811/5796}
}
urn: https://nbn-resolving.org/urn:nbn:de:hbz:5n-34222,
author = {{Mikhail Lemarenko}},
title = {The Belle II DEPFET Pixel Vertex Detector : Development of a Full-Scale Module Prototype},
school = {Rheinische Friedrich-Wilhelms-Universität Bonn},
year = 2013,
month = nov,
note = {The Belle II experiment, which will start after 2015 at the SuperKEKB accelerator in Japan, will focus on the precision measurement of the CP-violation mechanism and on the search for physics beyond the Standard Model. A new detection system with an excellent spatial resolution and capable of coping with considerably increased background is required. To address this challenge, a pixel detector based on DEPFET technology has been proposed. A new all silicon integrated circuit, called Data Handling Processor (DHP), is implemented in 65 nm CMOS technology. It is designed to steer the detector and preprocess the generated data. The scope of this thesis covers DHP tests and optimization as well the development of its test environment, which is the first Full-Scale Module Prototype of the DEPFET Pixel Vertex detector.},
url = {https://hdl.handle.net/20.500.11811/5796}
}
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